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ANSYS HFSS 2024 R2 Research tutorial

60 GHz 3D IC TSV–Micro-Bump–RDL Interconnect Modeling and Signal Integrity in HFSS 2024 R2 — Simulation Model and Output Guide

Investigate high-frequency interconnect behavior in a 3D IC transition comprising through-silicon vias, micro-bumps and redistribution-layer routes up to 60 GHz.

Overview

Investigate high-frequency interconnect behavior in a 3D IC transition comprising through-silicon vias, micro-bumps and redistribution-layer routes up to 60 GHz.

Research question and scope

Investigate high-frequency interconnect behavior in a 3D IC transition comprising through-silicon vias, micro-bumps and redistribution-layer routes up to 60 GHz.

A meaningful reproduction begins by documenting software version, sample or solver configuration, operating conditions and what the video actually demonstrates.

Modelling workflow

Construct a grounded stack-up with explicitly defined TSV barrels, dielectric liners, micro-bumps, RDL traces and reference conductors.

Assign conductor properties and dielectric loss parameters appropriate for the stated frequency range.

Configure wave/lumped terminals or differential ports consistently and validate port references before sweeping.

Extract S-parameters, inspect return loss, insertion loss, crosstalk and discontinuities while checking mesh convergence.

Signals and evidence to record

Insertion loss and return loss through 60 GHz

Near-end/far-end crosstalk for multiport models where ports exist

Current distribution and electric-field hot spots at transition discontinuities

Optional eye-diagram/BER estimates from separately documented channel post-processing

How to read the simulation output

S-parameters describe a linear channel, not an automatically computed PAM4 eye or BER. Accurate eye/BER analysis requires transmitter/receiver, equalization and channel-processing assumptions.

Check differential vs single-ended port definitions, conductor roughness, dielectric properties, mesh settings and whether an observed resonance belongs to the interconnect or a port/fixture artifact.

Research and engineering uses

Chiplet interconnects, heterogeneous packaging, high-speed chip-to-chip links, TSV/RDL optimization and signal-integrity research.

Use the demonstration as an introduction to the workflow, then develop independent comparison cases before treating any result as a research finding.

Related project watch pages

Watch the corresponding project video on its dedicated page. The descriptions above explain a potential validation workflow rather than reporting unverified numerical results.

OEM / PhD research support

For engineering simulation implementation, source models, reproducible comparisons or technical documentation, contact MATLAB Projects Code. Delivery scope and actual outputs depend on the verified model.

contents are for representative purposes, actual content may vary

Further technical reading

Further technical reading

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